Antemos Analytical Equipment Corp.
| Business category 1 | Electronic Measuring Instruments |
| City ( of main office ) | Longueuil, CA, Canada |
| Address | 885 Des Roselins |
| Phones | 1-514-6910711 |
| Fax | 1 |
| Web site | www.antemos.com |
| About | Antemos carries out development and delivery of systems of the analytical control of production, adapted under concrete industrial problems of the Customer. Thus monitoring systems can be based on various methods of the analysis. Now Antemos-one of innovative manufacturers the XRF-analyzers, the express train-analyzers and systems of measurement in real time for definition of a chemical compound of alloys on any basis, minerals, ores, glass, etc. Materials, and also for the ecological control. Antemos offers the express train-analyzers of structure of alloys and ores, glasses, paints. These are the desktop devices allowing within several minutes to receive element structure of the sample interesting you in the form of mass fractions of each element (in% or in other units offered by the Customer) . Analyzers of this type have well proved at the metallurgical enterprises. High metrological parameters at small duration of measurement, the small sizes, absence of necessity in the preparation of the simples and account materials do these analyzers convenient not only at the entrance control of raw material and the target control of production, but also and over the express train-control of course of swimming trunks. Antemos`s analyzers combine a number of unique qualities that does them in effect by new type of devices: devices are directly showing, i. E. They give out result of measurement directly in the interesting operator units of concentration. Unlike spectrometers available in the market, here the operator does not carry out any additional settlement operations with a spectrum, and at once receives target result. Devices are universal: at transition from one type of measured samples to another from the operator it is not required any additional re-calibrations and fine tunings of the device. For one measurement concentration of any necessary quantity of elements can be certain. The device can be used for examination of the sample of unknown structure. |
| Date | 2011 Oct 29, 00:10 |